Influence of Specimen Preparation on SEM Images and Comparison to LOM Images

Influence of topography and specimen preparation on backscattered electron images of bone.

Backscattered electron (BSE) images of bone exhibit graylevel contrast between adjacent lamellae. Mathematical models suggest that interlamellar contrast in BSE images is an artifact due to topographic irregularities. However, little experimental evidence has been published to support these models, and it is not clear whether submicron topographical features will alter BSE graylevels. The goal ...

Automated Interpretation of SEM Images

An important part of quality control in the fabrication of integrated circuit wafers involves making three-dimen sional measurements of the wafer’s surface topography. We describe a method for obtaining a dense depth map of the wafer surface from a single Scanning Electron Microscope (SEM) image. The depth map gives a complete description of the surface topography, allowing the easy calculation...

a comparison of teachers and supervisors, with respect to teacher efficacy and reflection

supervisors play an undeniable role in training teachers, before starting their professional experience by preparing them, at the initial years of their teaching by checking their work within the proper framework, and later on during their teaching by assessing their progress. but surprisingly, exploring their attributes, professional demands, and qualifications has remained a neglected theme i...

Surface Reconstruction From AFM and SEM Images

Curvelet Based Offline Analysis of SEM Images

Manual offline analysis, of a scanning electron microscopy (SEM) image, is a time consuming process and requires continuous human intervention and efforts. This paper presents an image processing based method for automated offline analyses of SEM images. To this end, our strategy relies on a two-stage process, viz. texture analysis and quantification. The method involves a preprocessing step, a...